Serial Test

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Abbreviation(s) and Synonym(s):

None

Definition(s):

The purpose of this test is to determine whether the number of occurrences of m-bit overlapping patterns is approximately the same as would be expected for a random sequence.
Source(s):
NISTIR 6390
NISTIR 6483

Glossary Comments

Comments about specific definitions should be sent to the authors of the linked Source publication. For NIST publications, an email is usually found within the document.

Comments about the glossary's presentation and functionality should be sent to secglossary@nist.gov.

See NISTIR 7298 Rev. 3 for additional details.

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Serial Test

Glossary Comments