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Conference Proceedings

Combinatorial Coverage Measurement Concepts and Applications

Published: March 22, 2013

Author(s)

Richard Kuhn (NIST), Itzel Dominguez Mendoza (Centro Nacional de Metrologia), Raghu Kacker (NIST), Yu Lei (UTA)

Conference

Name: Second International Workshop on Combinatorial Testing 2013 (IWCT 2013)
Dates: March 18-22, 2013
Location: Luxembourg, Luxembourg
Citation: Proceedings of the IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops (ICSTW 2013), pp. 352-361

Announcement

Abstract

Keywords

component; combinatorial testing; factor covering array; configuration model; state-space coverage; verification and validation (V&; V); t-way testing; null
Control Families

None selected

Documentation

Publication:
Conference Proceedings (DOI)

Supplemental Material:
Preprint (pdf)

Document History:
03/22/13: Conference Proceedings (Final)

Topics

Security and Privacy
testing & validation