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Conference Proceedings

CCM: A Tool for Measuring Combinatorial Coverage of System State Space

Published: October 10, 2013

Author(s)

Itzel Dominguez Mendoza, Richard Kuhn, Raghu Kacker, Yu Lei

Conference

Name: 2013 ACM / IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM 2013)
Dates: October 10-11, 2013
Location: Baltimore, Maryland, United States
Citation: Proceedings of the 2013 ACM / IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM 2013), pp. 291

Announcement

Abstract

Keywords

combinatorial testing; factor covering array; state-space coverage; t-way testing
Control Families

None selected

Documentation

Publication:
Conference Proceedings (DOI)

Supplemental Material:
None available

Document History:
10/10/13: Conference Proceedings (Final)