U.S. flag   An unofficial archive of your favorite United States government website
Dot gov

Official websites do not use .rip
We are an unofficial archive, replace .rip by .gov in the URL to access the official website. Access our document index here.

Https

Secure websites use HTTPS
A lock (Dot gov) or https:// means you've safely connected to our website. Please do not share sensitive information with us.

This is an archive
(replace .gov by .rip)

Conference Proceedings

A Method-Level Test Generation Framework for Debugging Big Data Applications

Published: December 10, 2018

Author(s)

Huadong Feng (UTA), Jaganmohan Chandrasekaran (UTA), Yu Lei (UTA), Raghu Kacker (NIST), Richard Kuhn (NIST)

Conference

Name: 2018 IEEE International Conference on Big Data (Big Data)
Dates: December 10-13, 2018
Location: Seattle, Washington, United States
Citation: Proceedings. 2018 IEEE International Conference on Big Data, pp. 221-230

Abstract

Keywords

testing; unit testing; big data application testing; test generation; test reduction; debugging; mutation testing
Control Families

None selected

Documentation

Publication:
Conference Proceedings (DOI)

Supplemental Material:
Preprint (pdf)

Document History:
12/10/18: Conference Proceedings (Final)

Topics

Security and Privacy
testing & validation

Technologies
big data