Published: June 02, 2021
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Name: 2021 IEEE/ACM 6th International Workshop on Metamorphic Testing (MET)
Dates: June 2021
Location: (Virtual) Madrid, Spain
Citation: 2021 IEEE/ACM 6th International Workshop on Metamorphic Testing: MET 2021, pp. 47-52
None selected
Publication:
Conference Proceedings (DOI)
Supplemental Material:
Preprint (pdf)
Document History:
06/02/21: Conference Proceedings (Final)
Security and Privacy
modeling; testing & validation
Technologies
software & firmware