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Conference Paper

Developing Federal Standards and Accreditations for Data Protection Products

Published: March 21, 1996

Author(s)

Lisa Carnahan (NIST)

Conference

Name: Photonics East '95
Dates: 10/22/1995 - 10/26/1995
Location: Philadelphia, Pennsylvania, United States
Citation: Proceedings. SPIE, vol. 2616, pp. 18-28

Abstract

Keywords

conformance testing; cryptographic module; security testing; validation
Control Families

None selected

Documentation

Publication:
https://doi.org/10.1117/12.232256

Supplemental Material:
None available

Document History:
03/21/96: Conference Paper (Final)

Topics

Security and Privacy

cryptography, testing & validation