Published: March 22, 2013
Author(s)
Richard Kuhn (NIST), Itzel Dominguez Mendoza (Centro Nacional de Metrologia), Raghu Kacker (NIST), Yu Lei (UTA)
Conference
Name: Second International Workshop on Combinatorial Testing 2013 (IWCT 2013)
Dates: 03/18/2013 - 03/22/2013
Location: Luxembourg, Luxembourg
Citation: Proceedings of the IEEE Sixth International Conference on Software Testing, Verification and Validation Workshops (ICSTW 2013), pp. 352-361
Combinatorial testing applies factor covering arrays to test all t-way combinations of input or configuration state space. In some testing situations, it is not practical to use covering arrays, but any set of tests covers at least some portion of t-way combinations up to t <= n. This report describes measures of combinatorial coverage that can be used in evaluating the degree of t-way coverage of any test suite, regardless of whether it was initially constructed for combinatorial coverage.
Combinatorial testing applies factor covering arrays to test all t-way combinations of input or configuration state space. In some testing situations, it is not practical to use covering arrays, but any set of tests covers at least some portion of t-way combinations up to t <= n. This report...
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Combinatorial testing applies factor covering arrays to test all t-way combinations of input or configuration state space. In some testing situations, it is not practical to use covering arrays, but any set of tests covers at least some portion of t-way combinations up to t <= n. This report describes measures of combinatorial coverage that can be used in evaluating the degree of t-way coverage of any test suite, regardless of whether it was initially constructed for combinatorial coverage.
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Keywords
component; combinatorial testing; factor covering array; configuration model; state-space coverage; verification and validation (V&; V); t-way testing; null
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