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Conference Paper

Estimating t-Way Fault Profile Evolution During Testing

Published: September 7, 2016

Author(s)

Richard Kuhn (NIST), Raghu Kacker (NIST), Yu Lei (UTSA)

Conference

Name: 2016 IEEE 40th Annual Computer Software and Applications Conference (COMPSAC)
Dates: 06/10/2016 - 06/14/2016
Location: Atlanta, Georgia, United States
Citation: Proceedings of the 2016 IEEE 40th Annual Computer Software and Applications Conference Workshops (COMPSACW 2016), pp. 596-597

Abstract

Keywords

testing; combinatorial testing; software fault
Control Families

None selected

Documentation

Publication:
https://doi.org/10.1109/COMPSAC.2016.110

Supplemental Material:
Preprint (pdf)

Document History:
09/07/16: Conference Paper (Final)

Topics

Security and Privacy

general security & privacy