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Conference Paper

Combinatorial Testing Metrics for Machine Learning

Published: April 12, 2021

Author(s)

Erin Lanus (Virginia Tech), Laura Freeman (Virginia Tech), Richard Kuhn (NIST), Raghu Kacker (NIST)

Conference

Name: 2021 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Dates: 04/12/2021 - 04/16/2021
Location: (Virtual) Porto de Galinhas, Brazil

Abstract

Keywords

combinatorial testing; machine learning; operating envelopes; transfer learning; test-set selection
Control Families

None selected

Documentation

Publication:
https://doi.org/10.1109/ICSTW52544.2021.00025

Supplemental Material:
Preprint (pdf)

Document History:
04/12/21: Conference Paper (Final)

Topics

Security and Privacy

testing & validation

Technologies

artificial intelligence, combinatorial testing