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Conference Paper

A Pseudo Exhaustive Software Testing Framework for Embedded Digital Devices in Nuclear Power

Published: June 14, 2021

Author(s)

Athira Jayakumar (Virginia Commonwealth University), Richard Kuhn (NIST), Brandon Simons (Virginia Commonwealth University), Aidan Collins (Virginia Commonwealth University), Smitha Gautham (Virginia Commonwealth University), Richard Hite (Virginia Commonwealth University), Raghu Kacker (NIST), Abhi Rajagopala (Virginia Commonwealth University), Carl Elks (Virginia Commonwealth University)

Conference

Name: 2021 ANS Virtual Annual Meeting
Dates: 06/14/2021 - 06/16/2021
Location: Virtual

Abstract

Keywords

Pseudo-exhaustive testing; t-way combinatorial testing; Nuclear I&C; Smart sensor
Control Families

None selected

Documentation

Publication:
https://doi.org/10.13182/T124-34544
Preprint (pdf)

Supplemental Material:
None available

Document History:
06/14/21: Conference Paper (Final)

Topics

Security and Privacy

testing & validation

Technologies

combinatorial testing, software & firmware