Published: June 14, 2021
Author(s)
Athira Jayakumar (Virginia Commonwealth University), Richard Kuhn (NIST), Brandon Simons (Virginia Commonwealth University), Aidan Collins (Virginia Commonwealth University), Smitha Gautham (Virginia Commonwealth University), Richard Hite (Virginia Commonwealth University), Raghu Kacker (NIST), Abhi Rajagopala (Virginia Commonwealth University), Carl Elks (Virginia Commonwealth University)
Conference
Name: 2021 ANS Virtual Annual Meeting
Dates: 06/14/2021 - 06/16/2021
Location: Virtual
The major challenge faced by the nuclear industry related to software testing of digital embedded devices is the identification of practical software (SW) testing solutions that provide a strong technical basis and is at the same time effective in establishing credible evidence of software CCF reduction. Towards this effort, we conducted a systematic empirical study on pseudo-exhaustive SW testing methods for embedded digital devices. In this paper, we describe the realization of a testbed for conducting an automated pseudo exhaustive software testing on embedded digital devices and the intricate interactions between the multiple software tools involved in the workflow. The collected results and derived findings confirm the ability of the automated pseudo exhaustive testing methodology to economically exercise the interaction input/state space in a systematic, rigorous, and comprehensive manner.
The major challenge faced by the nuclear industry related to software testing of digital embedded devices is the identification of practical software (SW) testing solutions that provide a strong technical basis and is at the same time effective in establishing credible evidence of software CCF...
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The major challenge faced by the nuclear industry related to software testing of digital embedded devices is the identification of practical software (SW) testing solutions that provide a strong technical basis and is at the same time effective in establishing credible evidence of software CCF reduction. Towards this effort, we conducted a systematic empirical study on pseudo-exhaustive SW testing methods for embedded digital devices. In this paper, we describe the realization of a testbed for conducting an automated pseudo exhaustive software testing on embedded digital devices and the intricate interactions between the multiple software tools involved in the workflow. The collected results and derived findings confirm the ability of the automated pseudo exhaustive testing methodology to economically exercise the interaction input/state space in a systematic, rigorous, and comprehensive manner.
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Keywords
Pseudo-exhaustive testing; t-way combinatorial testing; Nuclear I&C; Smart sensor
Control Families
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