This is a potential security issue, you are being redirected to https://csrc.nist.rip.
Fundamental background papers:
Empirical justification for combinatorial testing: D.R. Kuhn, D.R. Wallace, A.M. Gallo, Jr., Software Fault Interactions and Implications for Software Testing, IEEE Transactions on Software Engineering, vol. 30, no. 6, June 2004, pp. 418-421.Abstract; DOI: 10.1109/TSE.2004.24 Preprint. Comment: Investigates interaction level required to trigger faults in a large distributed database system.
IPOG algorithm used in construction of covering arrays: Y.Lei, R. Kacker, D.R. Kuhn, V. Okun and J. Lawrence, IPOG: a General Strategy for T-way Software Testing, 14th Annual IEEE International Conference and Workshops on the Engineering of Computer-Based Systems (ECBS’07), Tucson, Arizona, March 26-29 2007, pp. 549-556.Abstract; DOI: 10.1109/ECBS.2007.47; Preprint Comment: defines the In Parameter Order algorithm for high strength covering arrays.